high-density plasma etching system featuring an Inductively Coupled Plasma (ICP) method with a static magnetic field (ISM). It adopts a single-wafer structure and comes standard with an LL chamber. This model offers a compact design and low cost, making it an ideal choice for research and development.
Item | Specification |
System configuration | R&D/prototype system with Load Lock function |
Substrate size | Up to 150 mm |
Operating pressure (Pa) | 0.07 to 6.7 |
Uniformity within substrate/substrate to substrate surfaces | ±3% max. |
Substrate temperature control | Electrostatic chuck |
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