Batch-Type Native Oxide Removal SystemModel:RISE-300|Etching System|Products|ULVAC, Inc.
Etching System

A Batch System
to Remove Native OxideRISETM-300

The system is designed for the precise removal of native oxide in advanced semiconductor fabrication, supporting applications such as LSI deep contact bottoms and other narrow, high-aspect-ratio pattern structures.

This system is compatible with 300mm wafers.

Features

  • Damage-free (remote plasma and low-temperature process)
  • High throughput and low CoO
  • Processing in batches of fifty wafers
  • Superior uniformity of etching (5% or less per batch)
  • Easy maintenance
  • Small foot print compare to cluster type equipment
  • 50% lower self-aligned contact resistance compared to current wet process
  • The Smallest foot print

Applications

  • Pre-cleaning for self-aligned contact (SAC) formation
  • Pre-cleaning for capacitor formation
  • Pre-cleaning for epitaxial growth

Specifications

Model RISE-300
Plasma Source Microwave Power Supply
Configuration EFEM + LL + PM
Wafer Size φ300mm
Wafer Stage Ceramic Board (50 wafers/batch)
Pumping System Mechanical booster pump +DRP
Control System FAPC+TFT Touch Panel
Gas Supply 3 lines

This website use cookies to obtain and use access data to understand the convenience and usage of customers. If you agree to use cookies, click "I Accept".
[Privacy Plicy] [Cookie Policy]

I Accept