Process Technology for Wafer-level Packaging (WLP)

This post is also available in: Japanese Chinese (Simplified)

Introducing the sputtering, etching, and ashing technologies required for the WLP process.

Forming polymide(PI) fine Via

Forming a high aspect ratio Via structure by ashing

 

Seed metal deposition

ULVAC can introduce consistently process Degas ⇒ oxide film removal ⇒ Seed layer film formation. By doing it consistently, the adhesion of the Seed layer is also improved.

 

Etching Cu&Ti

Descum&Surface polishing

Remove ground residue by ashing

Footing removal for high aspect ratio Via

Footing can be removed by ashing even with a high aspect ratio

Desmear

 

Contact Us

https://www.ulvac.co.jp/en/contact/elec_inquiry/

Wafer level packaging fabrication flow

https://www.ulvac.co.jp/wiki/en/process_g_wlp/