| December 7, 2009 |
INITIUM to launch a novel QCM Molecular Interaction Analyzer,
AFFINIX QN Pro for properties change evaluation
INITIUM, Inc. |
| November 30, 2009 |
ULVAC, Inc. Launches ULKS Ver.3 Low-k Interlayer Dielectric Film Materials with Enhanced Plasma Damage Resistance
ULVAC, Inc. |
| November 27, 2009 |
ULVAC Inc. to Launch Luminous NA-8000, New Plasma Ashing System Compatible with Extensive Range of Organic Film Processes for Semiconductor/Electronic Parts
ULVAC, Inc. |
| September 14, 2009 |
ULVAC Inc. to Launch FABISEQ, an Equipment Diagnosis System for the Collection and Analysis of Equipment Data
ULVAC, Inc. |
| September 09, 2009 |
ULVAC Inc. Launches a Leak Detector for Automatic Helium Leak Test System, HELIOT ZERO
ULVAC, Inc. |
| July 06, 2009 |
ULVAC CRYOGENICS to Enter Cryogenic Cooler Business
ULVAC CRYOGENICS INC. |
| June 23, 2009 |
ULVAC, Inc. Launches the Multi-Probe Evaluation of Thin-film Characterization System for Tandem Type Thin-film Solar Cell MPEC-1300 Reduces the Initial Cost of Evaluation System Introduction to 1/2
ULVAC, Inc. |
| June 23, 2009 |
ULVAC, Inc. Developed and Launched the New PE-CVD System “CIM-1400” for Microcrystal Silicon Layer Utilized in Tandem Type Thin-film Silicon Photovoltaic Modules Production Turnkey line. Incorporated With this System, Conversion Efficiency is Increased by 30% and Manufacturing Cost per Watt (Wp) is Reduced by 10% Compared with a-Si Photovoltaic modules
ULVAC, Inc. |
| March 23, 2009 |
ULVAC-RIKO Announces RMP-1 Rapid Multi Property Measurement System
ULVAC, Inc. |
| January 05, 2009 |
ULVAC’s Turnkey Production Line of a-Si Thin film
Solar Cell Received a Nihon Keizai Shimbun Awards
for Excellence in the 2008 Nikkei Superior Products
and Services Awards
ULVAC, Inc. |